Device Fingerprinting

Safer and Optimised Vulnerability Scanning for Operational Technology through Integrated and Automated Passive Monitoring and Active Scanning

Abstract:

Vulnerability scanning of embedded sensors and controllers have a history of causing disruption and malfunction within operational technology environments. Traditional information technology vulnerability scanning generally consists of blunt exercising all or a large population of test conditions to understand how equipment responds. Often the large number and varied conditions of the tests are too much for embedded systems to handle. This paper presents a methodol-ogy and framework for integrating passive monitoring and active scanning techniques to optimise the type and amount of necessary active communication tests while achieving acceptable levels of device and vulnerability discovery. 

Published In

Volume 18, Issue 4

Journal of Information Warfare

The definitive publication for the best and latest research and analysis on information warfare, information operations, and cyber crime. Available in traditional hard copy or online.

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APT

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CIP
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The definitive publication for the best and latest research and analysis on information warfare, information operations, and cyber crime. Available in traditional hard copy or online.

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